Two-quantum photoemission yield spectrum of silicon
- 30 September 1981
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 39 (11) , 1213-1215
- https://doi.org/10.1016/0038-1098(81)91116-9
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Temperature dependence of the optical properties of siliconJournal of Applied Physics, 1979
- Electroreflectance and ellipsometry of silicon from 3 to 6 eVPhysical Review B, 1978
- Structure dependent oxidation of clean Si(111) surfacesSurface Science, 1976
- Surface states from photoemission threshold measurements on a clean, cleaved, Si (111) surfacePhysical Review B, 1975
- Intrinsic Optical Absorption in Single-Crystal Germanium and Silicon at 77°K and 300°KPhysical Review B, 1955