Photoemission yield under two-quantum excitation in Si
- 1 February 1981
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 23 (3) , 992-996
- https://doi.org/10.1103/physrevb.23.992
Abstract
It is shown for the first time that under pulsed laser excitation, photoemission from cleaned (7×7) Si (111) surfaces occurs at photon energies (3.7 to 2.3 eV) below the work function ( eV). We demonstrate its two-quantum origin by: (i) establishing the characteristic flux law, i.e., electron flux proportional to the square of photon flux, over six orders of magnitude; (ii) showing that the two-quantum yield falls very rapidly when photon energy decreases, no photoemission being observed below .
Keywords
This publication has 9 references indexed in Scilit:
- Incident angle and polarization dependence of four-photon photoemission from tungstenOptics Communications, 1979
- Measurement of Auger recombination in silicon by laser excitationSolid-State Electronics, 1978
- Two-photon photoemission from metals induced by picosecond laser pulsesPhysical Review B, 1977
- Structure dependent oxidation of clean Si(111) surfacesSurface Science, 1976
- Surface states from photoemission threshold measurements on a clean, cleaved, Si (111) surfacePhysical Review B, 1975
- Indirect Two-Photon Transitions in Si at 1.06 μmPhysical Review Letters, 1973
- The multiquantum photoemissive effect in condensed media and statistical characteristics of the multiquantum photocurrent (I)Physica Status Solidi (a), 1972
- Double-Photon Photoelectric Emission from Alkali AntimonidesPhysical Review B, 1968
- TWO-PHOTON PHOTOELECTRIC EFFECT IN Cs3Sb1Applied Physics Letters, 1964