Imaging of interfaces in semiconductor materials using high resolution transmission electron microscopy
- 31 December 1982
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 9 (3) , 215-219
- https://doi.org/10.1016/0304-3991(82)90202-9
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Fault-free silicon at the silicon/sapphire interfaceApplied Physics Letters, 1982
- Native tellurium dioxide layer on cadmium telluride: A high-resolution electron microscopy studyApplied Physics Letters, 1981
- Imaging of the silicon on sapphire interface by high-resolution transmission electron microscopyApplied Physics Letters, 1981
- Interphase-boundary dislocations and the concept of coherencyActa Metallurgica, 1979