Imaging of the silicon on sapphire interface by high-resolution transmission electron microscopy
- 15 March 1981
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 38 (6) , 439-441
- https://doi.org/10.1063/1.92389
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
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