Effects of melting on dielectric relaxation in poly(hexamethylene sebacamide) (nylon 610)

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Abstract
In order to investigate the role of solid morphology on molecular relaxation in crystaline polymers, the effect of melting on the α relaxation in poly(hexamethylene sebacamide) (nylon 610) was measured dielectrically. It was found that the α loss peak was continuous into the melt with respect to location in the frequency‐temperature domain and with respect to the shape of the peak. However, the strength of the process, as measured by the difference in the relaxed and unrelaxed dielectric constants, was discontinuous on melting, the process being much stronger in the melt. These observations are consistent with a two‐phase model of discrete crystalline and amorphous regions. The relaxation takes place in the amorphous regions, and melting creates more of this material but does not greatly after its nature. The correlation of the amount of amorphous material as measured by dielectric relaxation with that infrared from density measurements is discussed for nylon610, polyoxymethylene, and poly(ethylene oxide).