Hurter-Driffield exposure characteristics of oriented M centers in NaF
- 1 June 1976
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 47 (6) , 2371-2374
- https://doi.org/10.1063/1.323024
Abstract
The dichroism of the M and MA color centers in NaF is used for data storage. Optical‐density–vs–exposure (Hurter‐Driffield) curves are obtained for eight NaF samples with different impurity content and doping. Lithium‐doped NaF samples are found to exhibit a larger dichroism and a better sensitivity and fatigue resistance than other NaF samples.This publication has 10 references indexed in Scilit:
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