A high-resolution electron microscopy study of exsolution lamellae in enstatite

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Abstract
The interfaces between narrow augite exsolution lamellae and enstatite matrix are examined in detail by transmission electron microscopy using weak-beam and direct lattice imaging techniques. Direct observation of matrix planes with a (100) interplanar spacing (18–3 A) and the (200) lamella planes (4–6 A) at the interface between the two phases reveals steps or ledges usually one atomic plane high every few hundred Angstroms; growth of a lamella apparently involves the motion of ledges parallel to the interface. Terminating (200) lattice fringes, indicating the presence of a dislocation, are observed at each ledge. The dislocations, which are parallel to [010], also have an [001] component that stabilizes the structure by reducing the strain energy of the interface.