Determination of Relative Intensity in X-Ray Reflection Study
- 1 November 1965
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 36 (11) , 3432-3435
- https://doi.org/10.1063/1.1703011
Abstract
An analysis is made of the loss of x‐ray intensity for the reflection technique with respect to geometric arrangement of the specimen. Good agreement has been obtained between the analysis and experimental data from various materials of different lattice structures. The relative loss of intensity was found decreasing with higher index planes, i.e., shorter d spacings. This is considered advantageous in comparison with the transmission techniques of which the loss of intensity is greater for higher index planes.This publication has 5 references indexed in Scilit:
- Analysis of Certain Errors in the X-Ray Reflection Method for the Quantitative Determination of Preferred OrientationsJournal of Applied Physics, 1952
- Determination of Preferred Orientation in Flat Transmission Samples Using a Geiger Counter X-Ray SpectrometerJournal of Applied Physics, 1949
- A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray SpectrometerJournal of Applied Physics, 1949
- Preferred Orientation Determination Using a Geiger Counter X-Ray Diffraction GoniometerJournal of Applied Physics, 1948
- Eine neue Anordnung für röntgenkristallographische Untersuchungen von KristallpulverAnnalen der Physik, 1920