Optimum experimental conditions for quantitative surface microanalysis by reflection electron energy-loss spectroscopy
Open Access
- 1 January 1991
- journal article
- Published by EDP Sciences in Microscopy Microanalysis Microstructures
- Vol. 2 (2-3) , 301-314
- https://doi.org/10.1051/mmm:0199100202-3030100
Abstract
©1991 EDP Sciences. Article available at: http://mmm.edpsciences.org or http://dx.doi.org/10.1051/mmm:0199100202-3030100DOI: 10.1051/mmm:0199100202-3030100Experimental conditions for obtaining high quality core-shell ionization edges in reflection electron energy-loss spectroscopy (REELS) are investigated. Under the (600) specular- "mirror" reflection conditions and using the relative ionization cross-section measured from a MgO thin foil in the transmission geometry for collection semi-angle β = 1.2mrad, the chemical composition of MgO (100) surfaces is determined to be NO/NMg = 1.5 ± 0.15. This value is not significantly affected by varying the resonance diffraction conditions near the [001] zone axis, under which the spectra were acquired. An incorrect apparent composition will result if channeling effects along the [011] zone axis are not considered properly. Surface microanalysis is limited by the accuracy of the core-shell effective ionization cross-section (EICS), which depends not only on the property of a single atom but also on the dynamical elastic and inelastic scattering and channeling processes of electrons. An experimental method is outlined by which to measure the relative EICS from a thin foil specimen in the transmission case under the equivalent resonance conditions as in reflection geometryKeywords
This publication has 9 references indexed in Scilit:
- Surface microanalysis by reflection electron energy‐loss spectroscopyJournal of Electron Microscopy Technique, 1990
- The parabolas and circles in RHEED patternsUltramicroscopy, 1989
- Dynamical calculations for rheed and rem including the plasmon inelastic scatteringSurface Science, 1989
- Quantitative analysis of electron-energy-loss spectraUltramicroscopy, 1989
- Electron resonance reflections from perfect crystal surfaces and surfaces with stepsUltramicroscopy, 1989
- Scattering processes of high energy electrons in crystals surfacesMicron and Microscopica Acta, 1988
- Absolute determination of surface atomic concentration by Reflection Electron Energy-Loss Spectroscopy (REELS)Surface Science, 1988
- Reflection electron energy loss spectroscopy (reels): A technique for the study of surfacesSurface Science, 1988
- Electron energy loss spectra and reflection images from surfacesJournal of Microscopy, 1984