Range distribution characteristics of H+ and He++ ions with energies (5 to 2) × 103 keV implanted into silicon
- 16 November 1981
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 68 (1) , 69-75
- https://doi.org/10.1002/pssa.2210680109
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Small-angle multiple scattering of ions in the screened Coulomb region: I. Angular distributionsPublished by Elsevier ,2002
- Range parameters of protons in silicon implanted at energies from 0.5 to 300 keVNuclear Instruments and Methods, 1980
- Energy straggling of protons in Be, C, Al, and SiPhysical Review B, 1978
- Distribution of irradiation damage in silicon bombarded with hydrogenPhysical Review B, 1977
- Comparison of measured and calculated damage distributions for light keV ion bombardment of solid surfacesNuclear Instruments and Methods, 1976
- Hydrogen implantation in silicon between 1.5 and 60 kevRadiation Effects, 1976
- Multiple scattering and central limit theorem: A monte carlo approachPhysica Status Solidi (b), 1975
- Stopping cross sections and backscattering factors for 4He ions in matter Z = 1–92, E(4He) = 400–4000 keVAtomic Data and Nuclear Data Tables, 1974
- Heavy-ion range profiles and associated damage distributionsRadiation Effects, 1972
- Range-energy relation for low energy protons in Si and GeNuclear Instruments and Methods, 1967