Density of Thin Films of Vacuum Evaporated Metals
- 1 June 1968
- journal article
- letter
- Published by Springer Nature in Nature
- Vol. 218 (5147) , 1179-1180
- https://doi.org/10.1038/2181179a0
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A versatile thin film thickness monitor of high accuracyJournal of Scientific Instruments, 1967
- The Thickness Measurement of Thin Films by Multiple Beam InterferometryJournal of Applied Physics, 1950
- Interferometric Determination of Apparent Thickness of CoatingsNature, 1947