Electrical Measurements on Photographic Emulsion Grains. II. Photoelectronic Carriers

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Abstract
Pulses of electric field applied to silver bromide grains of a photographic emulsion at short time intervals after the application of short light flashes cause displacement of photoelectrons and holes if their lifetimes are greater than the delay interval. The asymmetry in the location of the photoproducts—microscopically visible silver and bromine or developable latent‐image specks—is an indication of the fraction of carriers free at the time the electric field is applied. As the delay interval is varied, the decay of the number of free carriers may be followed. In the emulsion system studied, the number of photoelectrons was found to decay approximately according to a 1/(1+αt) law, falling to half the initial value in 0.25 μsec. The lack of a dependence on intensity or temperature is taken to indicate temporary trapping in a distribution of shallow traps, perhaps at the grain surface. The number of free holes decays by an exponential law, with a mean lifetime of about 15 μsec. Indications are that hole mobility is very low, owing either to temporary trapping or self‐trapping. The implications of these results in terms of modern theories of latent‐image formation are discussed.

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