A structured approach to macrocell testing using built-in self-test

Publisher Website

4 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/cicc.1990.124820

Abstract

No abstract available

Keywords

This publication has 3 references indexed in Scilit:

Circular BIST with partial scan
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
Built-in Self Testing of Embedded Memories
IEEE Design & Test of Computers, 1986
Built-In Self-Test Techniques
IEEE Design & Test of Computers, 1985