Reliability analysis of transmission lines with common mode failures when repair times are arbitrarily distributed
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Power Systems
- Vol. 3 (3) , 1012-1019
- https://doi.org/10.1109/59.14555
Abstract
The authors present the evaluation of the probability and frequency of failure for a system of two parallel redundant transmission lines with common mode failure. The component down times are assumed to follow an overdispersed Gamma distribution. The two system models are presented based, respectively, on the parallel device of stages on the use of supplementary variables. The results are checked by Monte Carlo simulations. The merits of the supplementary variable model are pointed out and the relevance of the form of the distribution as well as the necessity of a careful statistical analysis of the actual failure data is addressed. It is shown that, for a Gamma distribution with shape parameter less than unity, the form of the down-time distribution can have an orders-of-magnitude effect on the probability of failure.<>Keywords
This publication has 10 references indexed in Scilit:
- Discrete-event simulation of load point interruptionsSIMULATION, 1985
- Reliability Modeling of Multiple Overhead Transmission LinesIEEE Transactions on Reliability, 1985
- An analysis of supergrid transmission fault data in a specific area of England and WalesReliability Engineering, 1985
- Non-Markovian Models for Common Mode Failures in Transmission SystemsIEEE Power Engineering Review, 1982
- Transmission Line Reliability Models Including Common mode and Adverse Weather EffectsIEEE Transactions on Power Apparatus and Systems, 1981
- Application of Common-Cause Outage Models in composite System Reliability EvaluationIEEE Transactions on Power Apparatus and Systems, 1981
- Common cause failures—a dilemma in perspectiveReliability Engineering, 1980
- Common-Cause Outages In Multiple Circuit Transmission LinesIEEE Transactions on Reliability, 1978
- On common-cause failures—BibliographyMicroelectronics Reliability, 1978
- The analysis of non-Markovian stochastic processes by the inclusion of supplementary variablesMathematical Proceedings of the Cambridge Philosophical Society, 1955