On common-cause failures—Bibliography
- 1 January 1978
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 18 (6) , 533-534
- https://doi.org/10.1016/0026-2714(78)90116-6
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
- A 1-out-of-N:G System with Duplex ElementsIEEE Transactions on Reliability, 1979
- Common-Cause Outages In Multiple Circuit Transmission LinesIEEE Transactions on Reliability, 1978
- Probabilistic Evaluation of Failure Modes Leading to the Mispositioning of Certain ECCS Motor Operated Valves in WestingHouse NSSSIEEE Transactions on Power Apparatus and Systems, 1978
- Effects of Weibull hazard rate on common cause failure analysis of reliability networksMicroelectronics Reliability, 1978
- A k-out-of-n three-state devices system with common-cause failuresMicroelectronics Reliability, 1978
- A 4-Unit Redundant System with Common-Cause FailuresIEEE Transactions on Reliability, 1977
- COMCAN¿A Computer Code for Common-Cause AnalysisIEEE Transactions on Reliability, 1977
- The effect of a certain class of potential common mode failures on the reliability of redundant systemsNuclear Engineering and Design, 1976
- A modification to fault tree “AND” gateMicroelectronics Reliability, 1976
- Probabilistic assessment of aircraft hazard for nuclear power plantsNuclear Engineering and Design, 1972