A modification to fault tree “AND” gate
- 1 January 1976
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 15 (6) , 625-626
- https://doi.org/10.1016/0026-2714(76)90281-x
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- An introduction to fault tree analysis with emphasis on failure rate evaluationMicroelectronics Reliability, 1975
- Fault TreesߞA State of the Art DiscussionIEEE Transactions on Reliability, 1974