X-ray step scanning topography
- 16 June 1974
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 23 (2) , 537-542
- https://doi.org/10.1002/pssa.2210230225
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- A modified method of limited X-ray topographsPhysica Status Solidi (a), 1973
- X-ray observations of induced dislocations at simple planar structures in siliconPhysica Status Solidi (a), 1973
- Observations of Dislocations in Phosphorus-Diffused Silicon by X-Ray and Etching TechniquesJapanese Journal of Applied Physics, 1968
- New X-Ray Diffraction Microscopy Technique for the Study of Imperfections in Semiconductor CrystalsJournal of Applied Physics, 1965
- X-Ray Observations of Diffusion-Induced Dislocations in SiliconJournal of Applied Physics, 1962
- The energy flow of X-rays in an ideally perfect crystal: comparison between theory and experimentsActa Crystallographica, 1960