Non-contacting determination of carrier lifetime and surface recombination velocity using photothermal radiometry
- 31 January 1990
- journal article
- Published by Elsevier in Materials Science and Engineering: B
- Vol. 5 (2) , 101-105
- https://doi.org/10.1016/0921-5107(90)90039-e
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Semiconductor assessment using photothermal radiometryInfrared Physics, 1988
- Theory of the photoacoustic effect in semiconductors influence of carrier diffusion and recombinationApplied Optics, 1982
- A generalized model of photothermal radiometryJournal of Applied Physics, 1982
- Optoacoustic and photothermal material inspection techniquesApplied Optics, 1982
- Photothermal RadiometryPhysica Scripta, 1979