Combinatorial approach to the edge delamination test for thin film reliability—concept and simulation
- 1 August 2003
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 437 (1-2) , 197-203
- https://doi.org/10.1016/s0040-6090(03)00585-6
Abstract
No abstract availableKeywords
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