Manifestation of zero-point quantum fluctuations in atomic force microscopy
- 15 July 1990
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 42 (3) , 1541-1546
- https://doi.org/10.1103/physrevb.42.1541
Abstract
Based on rigorous quantum-field theory, long-range probe-sample dispersion forces in atomic force microscopy are analyzed. The interactions, being attractive or repulsive, can be divided into a purely geometrical part, depending on probe geometry and working distance, and a solely material-dependent part given in terms of the dielectric permittivities involved. The calculations are consistent with published experimental data and promise new analytical possibilities opened by ‘‘dispersion microscopy.’’Keywords
This publication has 28 references indexed in Scilit:
- Scanning tunneling microscope instrumentationReview of Scientific Instruments, 1989
- Incremental Charging of Single Small ParticlesPhysical Review Letters, 1988
- Atomic resolution atomic force microscopy of graphite and the ‘‘native oxide’’ on siliconJournal of Vacuum Science & Technology A, 1988
- Atomic-scale friction of a tungsten tip on a graphite surfacePhysical Review Letters, 1987
- Scanning tunneling microscopy—from birth to adolescenceReviews of Modern Physics, 1987
- Tip Surface Interactions in STM and AFMPhysica Scripta, 1987
- Chapter 1 Solids in ContactMaterials Science and Engineering, 1986
- Atomic Force MicroscopePhysical Review Letters, 1986
- Theory of the bimetallic interfacePhysical Review B, 1985
- Universal Binding Energy Curves for Metals and Bimetallic InterfacesPhysical Review Letters, 1981