REM and REELS identifications of atomic terminations at α-alumina (011) surface
- 1 February 1989
- journal article
- Published by Elsevier in Surface Science
- Vol. 208 (3) , 533-549
- https://doi.org/10.1016/0039-6028(89)90017-4
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Absolute determination of surface atomic concentration by Reflection Electron Energy-Loss Spectroscopy (REELS)Surface Science, 1988
- Reflection electron energy loss spectroscopy (reels): A technique for the study of surfacesSurface Science, 1988
- Surface plasmon excitation for supported metal particlesUltramicroscopy, 1987
- Electron resonance channeling on crystal surfaces in reflection high energy electron diffraction geometryUltramicroscopy, 1987
- Convergent-beam reflection high-energy electron diffraction (RHEED) observations from an Si(111) surfaceActa Crystallographica Section A Foundations of Crystallography, 1986
- High Resolution Imaging of As-Grown Sapphire SurfacesMRS Proceedings, 1985
- Atomic and other structures of cleaved GaAs(110) surfacesSurface Science, 1984
- Surface reactions and excitationsUltramicroscopy, 1983
- Composition and surface structure of the (0001) face of .alpha.-alumina by low-energy electron diffractionThe Journal of Physical Chemistry, 1970
- LEED Studies of the (0001) Face of α-AluminaJournal of Applied Physics, 1968