Resonant dielectronic and direct excitation in crystal channels
- 14 August 1989
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 63 (7) , 742-745
- https://doi.org/10.1103/physrevlett.63.742
Abstract
We have observed dielectronic and direct excitation of H-like and and He-like ions in silicon channels caused by collision with weakly bound target electrons which behave as a free-electron gas. As in vacuo, relaxation of the doubly excited states can occur radiatively leading to ions of decreased charge, but in a crystal channel collisional effects can cause double ionization. The effects are seen in both the x-ray yields and charge-state fractions, and, in the case of , in charge-state x-ray coincidences.
Keywords
This publication has 6 references indexed in Scilit:
- Electron Impact Ionization of-Physical Review Letters, 1988
- Observation of radiative electron capture intoK,L,Mshells of 25-MeV/uions channeled in siliconPhysical Review Letters, 1987
- Simulated Lyman-alpha and dielectronic satellite spectra, Z = 6–20Atomic Data and Nuclear Data Tables, 1981
- Radiative electron capture by oxygen ions in single-crystal channels: Experiment and theoryPhysical Review B, 1979
- Lifetime of theState of Heliumlike Argon () and Heliumlike Titanium ()Physical Review Letters, 1973
- Charge-changing collisions of channeled oxygen ions in goldRadiation Effects, 1972