Ion scattering: a spectroscopic tool for study of the outermost atomic layer of a solid surface
- 1 June 1972
- journal article
- Published by Elsevier in Chemical Physics Letters
- Vol. 14 (3) , 380-384
- https://doi.org/10.1016/0009-2614(72)80138-6
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Analysis of surface composition with low-energy backscattered ionsSurface Science, 1971
- Surface Composition Analysis by Binary Scattering of Noble Gas IonsJournal of Vacuum Science and Technology, 1970
- Chlorine reactions on the Si (111) surfaceSurface Science, 1969
- High-Resolution Study of Electron-Impact Spectra at Kinetic Energies between 33 and 100 eV and Scattering Angles to 16°The Journal of Chemical Physics, 1968
- Electron Monochromator DesignReview of Scientific Instruments, 1967
- Low-Energy Electron Diffraction Study of Silicon Surface StructuresThe Journal of Chemical Physics, 1962