Conventional depth profiling using narrow nuclear resonances

This publication has 12 references indexed in Scilit:

• High energy resolution ion beam techniques for novel investigations in nuclear, atomic and applied physics using narrow nuclear resonances
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1992
• Use of simulations of 15N profiling in studying hydrogen segregation at interfaces
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1992
• Computer simulation of dose effects on composition profiles under ion implantation
  Journal of Applied Physics, 1991
• Temperature and dose dependences of nitrogen implantation into aluminium
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1990
• Comparison between diffusion of 15N N and 14N in implanted iron
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987
• High resolution techniques for nuclear reaction narrow resonance width measurements and for shallow depth profiling
  Nuclear Instruments and Methods in Physics Research, 1983
• High resolution depth profiling of F, Ne and Na in materials
  Nuclear Instruments and Methods in Physics Research, 1983
• A simple, digitally controlled, automatic, hysteresis free, high precision energy scanning system for Van de Graaff type accelerators: Part I: Principle, results and applications
  Nuclear Instruments and Methods in Physics Research, 1983
• Depth profiling with narrow resonances of nuclear reactions: Theory and experimental use
  Nuclear Instruments and Methods in Physics Research, 1982
• Ranges of some light ions measured by (p, γ) resonance broadening
  Radiation Effects, 1977