Study of ultra-thin Ge/Si strained layer superlattice
- 2 February 1989
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 95 (1-4) , 451-454
- https://doi.org/10.1016/0022-0248(89)90440-5
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
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