A limited study of the effects of contact normal force, contact geometry and wipe distance on contact resistance of gold-plated contacts
- 6 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 198-207
- https://doi.org/10.1109/ecc.1988.12594
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- A System for Analyzing Contact ResistanceIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1979
- Base Metal Contacts: An Exploratory Study of Separable Connection to Tin-LeadIEEE Transactions on Parts, Hybrids, and Packaging, 1975
- Automated Contact Resistance ProbeReview of Scientific Instruments, 1963
- The influence of dust particles on the contact of solidsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1956