Fundamental concepts of stem imaging
- 1 January 1981
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 7 (1) , 7-12
- https://doi.org/10.1016/0304-3991(81)90017-6
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
- The critical-voltage effect in convergent-beam high-voltage electron diffractionActa Crystallographica Section A, 1980
- Approximations for dynamical calculations of microdiffraction patterns and images of defectsActa Crystallographica Section A, 1978
- Limiting factors in specimen thickness in conventional and scanning transmission electron microscopyPhilosophical Magazine, 1977
- The nature of defocus fringes in scanning‐transmission electron microscope imagesJournal of Microscopy, 1976
- Fresnel fringes in stemUltramicroscopy, 1976
- Scanning transmission electron microscopy of thin specimensUltramicroscopy, 1976
- IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPEApplied Physics Letters, 1969
- Reciprocity in electron diffraction and microscopyActa Crystallographica Section A, 1968
- Energy Dependence of Extinction Distance and Transmissive Power for Electron Waves in CrystalsJournal of Applied Physics, 1964
- Die Fluoreszenzröntgenstrahlung von Einkristallen (Mit einem Anhang über Elektronenbeugung)Annalen der Physik, 1935