Measurements of the open-circuit photovoltage decay in a silicon solar cell
- 30 September 1983
- journal article
- Published by Elsevier in Solar Cells
- Vol. 9 (4) , 289-293
- https://doi.org/10.1016/0379-6787(83)90023-6
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Determination of the minority carrier lifetime in the base of a back-surface field solar cell by forward current-induced voltage decay and photovoltage decay methodsSolar Cells, 1982
- Theory of open-circuit photovoltage decay in a finite base solar cell with drift fieldJournal of Physics D: Applied Physics, 1982
- Minority carrier life-time determination from steady state and transient response of a solar cell under illuminationInternational Journal of Electronics, 1982
- Theory of photo induced open circuit voltage decay in a solar cellSolid-State Electronics, 1981
- Mathematical formulation for the photo-induced open circuit voltage decay method for measurement of minority carrier lifetime in solar cellsIEEE Electron Device Letters, 1981
- Measurement of minority carrier lifetime in solar cells from photo-induced open-circuit voltage decayIEEE Transactions on Electron Devices, 1979