An XPS and UPS photoemission study of HgO
- 31 October 1986
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 60 (1) , 21-24
- https://doi.org/10.1016/0038-1098(86)90007-4
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Relaxation energies of oxygen auger transitions in some oxidesJournal of Electron Spectroscopy and Related Phenomena, 1985
- XPS: Energy calibration of electron spectrometers. 2—Results of an interlaboratory comparisonSurface and Interface Analysis, 1984
- XPS: Energy calibration of electron spectrometers. 1—An absolute, traceable energy calibration and the provision of atomic reference line energiesSurface and Interface Analysis, 1984
- A new charge-correction method in X-ray photoelectron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1983
- X‐ray photoelectron study of surface compounds formed during flotation of mineralsSurface and Interface Analysis, 1980
- Core and valence orbitals in solid and gaseous mercury by means of ESCAJournal of Electron Spectroscopy and Related Phenomena, 1976
- Photoemission and density of valence states of the H‐YI compounds II. ZnSe, CdS, and HgSPhysica Status Solidi (b), 1973
- Photoemission and density of valence states of the II–VI compounds. I. ZnTe, CdSe, CdTe, HgSe, and HgTePhysica Status Solidi (b), 1973
- Electronic Core Levels of theCompoundsPhysical Review B, 1971
- Reevaluation of X-Ray Atomic Energy LevelsReviews of Modern Physics, 1967