Random uncertainties in AES and XPS: I: Uncertainties in peak energies, intensities and areas derived from peak synthesis
- 1 May 1992
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 18 (5) , 345-360
- https://doi.org/10.1002/sia.740180508
Abstract
No abstract availableKeywords
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