The determination of uncertainties in quantitative XPS/AES and its impact on data acquisition strategy
- 1 May 1992
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 18 (5) , 368-376
- https://doi.org/10.1002/sia.740180510
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Estimation of the uncertainties associated with XPS peak intensity determinationSurface and Interface Analysis, 1992
- Random uncertainties in AES and XPS: I: Uncertainties in peak energies, intensities and areas derived from peak synthesisSurface and Interface Analysis, 1992
- Random uncertainties in AES and XPS: II: Quantification using either relative or absolute measurementsSurface and Interface Analysis, 1992
- Smoothing and the signal-to-noise ratio of peaks in electron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1989
- Quantitative AES: The establishment of a standard reference spectrum for the accurate determination of spectrometer transmission functionsSurface and Interface Analysis, 1988
- A model for determining the composition of layer structured samples using XPS electron take‐off angle experimentsSurface and Interface Analysis, 1986
- Signal‐to‐noise measurement in X‐ray photoelectron spectroscopySurface and Interface Analysis, 1985
- Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysisSurface and Interface Analysis, 1981
- High-Resolution X-Ray Photoemission Spectrum of the Valence Bands of GoldPhysical Review B, 1972
- Errors of Observation and their TreatmentPublished by Springer Nature ,1972