Exchange coupling between a soft and a hard ferromagnetic thin film
- 15 April 1988
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 63 (8) , 3244-3246
- https://doi.org/10.1063/1.340855
Abstract
An investigation of exchange coupling mechanism in a double film formed of the amorphous Co1−xTix and polycrystalline Co1−x−yPtxTiy layer is reported. The thin films were prepared by rf diode sputtering. The amorphous layer presents the characteristics of a soft ferromagnet (Hc<1Oe) and an in-plane induced uniaxial anisotropy Hk. The CoPtTi hard layer exhibits a large Hc. The exchange mechanism was characterized by the shift Hs of the in-plane hysteresis loop, and by ferromagnetic resonance measurements. The effect of interface contamination by oxygen upon the interfacial exchange constant is pointed out.This publication has 6 references indexed in Scilit:
- Evidence for Structure-Related Induced Anisotropy in Amorphous CoTi Soft Ferromagnetic Thin FilmsPhysical Review Letters, 1986
- Magnetic and microstructural properties of CoPtTi thin filmsIEEE Transactions on Magnetics, 1986
- Field induced anisotropy in amorphous Co100−xTix thin filmsJournal of Applied Physics, 1984
- F. M. R. characterization of exchange-coupling between a soft and a hard magnetic filmJournal of Applied Physics, 1979
- Permanent magnet films for biasing of magnetoresistive transducersIEEE Transactions on Magnetics, 1975
- Magnetization and Switching Characteristics of Composite Thin Magnetic FilmsJournal of Applied Physics, 1965