Microstructure and growth kinetics of CrSi2 on Si{100} studied using cross-sectional transmission electron microscopy
- 1 January 1985
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 123 (1) , 69-85
- https://doi.org/10.1016/0040-6090(85)90042-2
Abstract
No abstract availableKeywords
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