Near-Surface Analysis of Semiconductor Using Grazing Incidence X-ray Fluorescence

This publication has 6 references indexed in Scilit:

• Characterization and analysis of detector materials and processes
  Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1987
• X-Ray Fluorescence Analysis of Hg in SiO₂ Films Deposited by Hg-Sensitized Photo-CVD
  Japanese Journal of Applied Physics, 1986
• Grazing incidence X-ray fluorescence analysis
  Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1986
• Synchrotron radiation excited x-ray fluorescence analysis using total reflection of x-rays
  Analytical Chemistry, 1986
• Concentration Profile of a Dissolved Polymer near the Air-Liquid Interface: X-Ray Fluorescence Study
  Physical Review Letters, 1985
• Stoichiometry measurements of GaAs by means of 15-MeV He++ backscattering
  Journal of Applied Physics, 1979