A Metastable Alpha-Particle Irradiation Induced Defect in n-GaAs

Abstract
We report the introduction and characterization of a metastable alpha-particle irradiation induced defect, Eα8, in n-GaAs by deep level transient spectroscopy (DLTS) using Schottky barrier diodes. The Eα8 defect, with an energy level 0.18 eV below the conduction band, as determined by low-field DLTS measurements, could be reversibly transformed (removed and re-introduced) by employing zero and reverse bias anneals, respectively, in the 100–140 K temperature range. The transformation kinetics of Eα8 displayed first order behaviour and was found to be charge state dependant.