Méthode absolue d'analyse quantitative d'échantillons métalliques minces par fluorescence X
- 1 January 1982
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 87 (3) , 195-201
- https://doi.org/10.1016/0040-6090(82)90356-x
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- X‐ray fluorescence analysis without standardsX-Ray Spectrometry, 1980
- X-ray fluorescence analysis without standards of small particles extracted from super-alloysX-Ray Spectrometry, 1980
- Analysis of the Nb-Ge content in thin films by quantitative x-ray fluorescenceX-Ray Spectrometry, 1980
- A versatile thin film thickness monitor of high accuracyJournal of Scientific Instruments, 1967