Combination of surface characterization techniques for investigating optical thin-film components
- 1 September 1996
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 35 (25) , 5052-5058
- https://doi.org/10.1364/ao.35.005052
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 4 references indexed in Scilit:
- Atomic force microscopy on cross-sections of optical coatings: a new methodThin Solid Films, 1995
- Relation between light scattering and the microstructure of optical thin filmsApplied Optics, 1993
- Relationship between Surface Scattering and Microtopographic FeaturesOptical Engineering, 1979