Relation between light scattering and the microstructure of optical thin films
- 1 October 1993
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 32 (28) , 5475-5480
- https://doi.org/10.1364/ao.32.005475
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 19 references indexed in Scilit:
- Scattering study of single layer titania filmsApplied Optics, 1989
- Surface smoothing and roughening by dielectric thin film depositionApplied Optics, 1988
- Interface roughness cross-correlation laws deduced from scattering diagram measurements on optical multilayers: effect of the material grain sizeJournal of the Optical Society of America B, 1987
- Effect of ion assisted deposition on optical scatter and surface microstructure of thin filmsJournal of Vacuum Science & Technology A, 1985
- Theory of light scattering from a rough surface with an inhomogeneous dielectric permittivityPhysical Review B, 1984
- Surface roughness measurements of low-scatter mirrors and roughness standardsApplied Optics, 1984
- Microstructure of vapor-deposited optical coatingsApplied Optics, 1984
- Relationship of the total integrated scattering from multilayer-coated optics to angle of incidence, polarization, correlation length, and roughness cross-correlation propertiesApplied Optics, 1983
- Infrared light scattering from surfaces covered with multiple dielectric overlayersApplied Optics, 1977
- Morphology and light scattering of dielectric multilayer systemsThin Solid Films, 1976