Imaging of Micro-Cracks by Photo-Displacement Microscopy

Publisher Website

1 January 1984

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 647-650
https://doi.org/10.1109/ultsym.1984.198378

Abstract

No abstract available

Keywords

This publication has 6 references indexed in Scilit:

Characterization of surface defects using a pulsed acoustic laser probe
Applied Physics Letters, 1984
Thermal wave imaging of closed cracks in opaque solids
Journal of Applied Physics, 1983
Photodisplacement microscopy using a semiconductor laser
Electronics Letters, 1982
Thermodisplacement imaging of current in thin-film circuits
Electronics Letters, 1982
Scattering of Rayleigh surface waves by edge cracks: Numerical simulation and experiment
The Journal of the Acoustical Society of America, 1982
Thermal wave microscopy with photoacoustics
Journal of Applied Physics, 1980