Thickness dependence of the properties of plasma-deposited a-Si:H films — NMR studies
- 1 July 1984
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 66 (1) , 127-132
- https://doi.org/10.1016/0022-3093(84)90310-7
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
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