Universal Test Sets for Logic Networks
- 1 September 1973
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-22 (9) , 835-839
- https://doi.org/10.1109/tc.1973.5009174
Abstract
This paper examines the problem of finding a single universal test set that will test any of a variety of different implementations of a given switching function. It is shown that, for AND/OR networks, universal test sets may be found that detect not only all single faults but all multiple faults as well. The minimality and size of these sets are examined and their derivation for incomplete functions is described.Keywords
This publication has 7 references indexed in Scilit:
- Derivation of Minimum Test Sets for Unate Logical CircuitsIEEE Transactions on Computers, 1971
- Minimal Sets of Distinct Literals for a Logically Passive FunctionJournal of the ACM, 1971
- Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic CircuitsIEEE Transactions on Electronic Computers, 1967
- On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic NetsIEEE Transactions on Electronic Computers, 1966
- A Truth Table Method for the Synthesis of Combinational LogicIRE Transactions on Electronic Computers, 1961
- Unate Truth FunctionsIEEE Transactions on Electronic Computers, 1961
- Ein Satz ber Untermengen einer endlichen MengeMathematische Zeitschrift, 1928