Photoelectric Emission and Work Function of InP
- 11 February 1966
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 142 (2) , 519-523
- https://doi.org/10.1103/physrev.142.519
Abstract
The work function and photoemissive properties at photon energies between 2.5 and 6.2 eV have been measured for the (110) surface of InP cleaved in high vacuum and covered with various amounts of cesium. The work function of the clean surface is 4.65±0.1 eV. With the interpretation that the measured photoelectric threshold eV corresponds to excitation from the top of the valence band at the surface, one obtains an electron affinity eV and a position of the Fermi level with respect to the top of the valence band eV at the surface. The photoelectric yield and energy distributions from the cesium-covered surface disclose the existence of two broad peaks in the density of states in the conduction band. Structure due to critical points is observed in the yield spectrum and can be correlated with the corresponding structure in reflectivity.
Keywords
This publication has 21 references indexed in Scilit:
- Band Structures and Pseudopotential Form Factors for Fourteen Semiconductors of the Diamond and Zinc-blende StructuresPhysical Review B, 1966
- Reflectivity, Photoelectric Emission, and Work Function of AlSbPhysical Review B, 1965
- Spectral Analysis of Photoemissive Yields in Si, Ge, GaAs, GaSb, InAs, and InSbPhysical Review B, 1965
- Band-Theoretic Model for the Photoelectric Effect in SiliconPhysical Review B, 1965
- Photoelectric Properties of Cleaved GaAs, GaSb, InAs, and InSb Surfaces; Comparison with Si and GePhysical Review B, 1965
- Photoelectric properties and work function of cleaved germanium surfacesSurface Science, 1964
- Photo-emission from semiconductor surfacesPhysics Letters, 1963
- Reflectance and Photoemission From SiPhysical Review Letters, 1962
- Photoemissive Studies of the Band Structure of SiliconPhysical Review Letters, 1962
- Direct and Indirect Excitation Processes in Photoelectric Emission from SiliconPhysical Review B, 1962