X-ray and Raman scattering characterization of Ge/Si buried layers
- 15 February 1993
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 62 (7) , 687-689
- https://doi.org/10.1063/1.108840
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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