Temperature dependence of the domain wall width in LaAlO3
- 15 January 1999
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 85 (2) , 722-727
- https://doi.org/10.1063/1.369152
Abstract
Twin wall related diffuse scattering intensities from a single crystal of LaAlO3 were determined using high-resolution x-ray diffraction methods. Rocking curves were measured for sample temperatures between 295 and 900 K. The wall thickness W was determined by comparing the observed diffraction profiles with structure factor calculations for a tanh(x/W) wall profile. It is shown that W≈20 Å at low temperatures and increases slowly with temperature reaching values in excess of 200 Å near Tc≈850 K with W∝|T−Tc|−1.This publication has 40 references indexed in Scilit:
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