Current crouding and flux divergence in defected stripe

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Abstract
A mathematical analysis of the variation of resistance and the electric line of force over a greion in a conducting strupe with a geometrical defect is carried out based on the Christoffel-Schwarz transformation. The overall resistance of the sripe with a bump-type defect may turn out to be less than that of homogeneous stripe of the same physical length despite the added resistance due to the current crowding. Possible implications of this effect are pointed out. The electromigration flux divergence at the edige of a void or a cracking is substantially greater than that at the edge of the bump-type defect. This is in line with the notion that stripe cracking or a faceted void in its embryonic stage first nucleated at the grain-boundary triple points.