Microdensitometer analysis of electron micrographs of shadowed surface replicas: A powerful method in surface structure characterization
- 3 October 1985
- journal article
- Published by Elsevier in Surface Science
- Vol. 162 (1-3) , 985-990
- https://doi.org/10.1016/0039-6028(85)91010-6
Abstract
No abstract availableKeywords
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