Elimination of charging in the proton-induced x-ray emission analysis of insulating samples
- 1 December 1975
- journal article
- other
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 131 (2) , 377-379
- https://doi.org/10.1016/0029-554x(75)90344-4
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Quantitative trace element analyses in thick samples with heavy-ion-induced x-ray fluorescenceJournal of Applied Physics, 1973
- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970