On the depth profiles by ESCA
- 2 July 1976
- journal article
- other
- Published by Elsevier in Surface Science
- Vol. 57 (2) , 779-780
- https://doi.org/10.1016/0039-6028(76)90366-6
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Analysis profiles of oxide films on chrome steel by auger emission and x-ray photoelectron spectroscopiesJournal of Electron Spectroscopy and Related Phenomena, 1974
- Electron spectroscopy studies of adsorption and oxidation processes at metal surfacesJournal of Electron Spectroscopy and Related Phenomena, 1974
- Study of the x-ray photoelectron spectrum of tungsten—tungsten oxide as a function of thickness of the surface oxide layerJournal of Electron Spectroscopy and Related Phenomena, 1973