Automatic registration of scanning electron microscope images
- 31 December 1987
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 7 (2-4) , 215-221
- https://doi.org/10.1016/s0167-9317(87)80014-x
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A Fully-Automated Electron Beam Test System for VLSI CircuitsIEEE Design & Test of Computers, 1985
- A new domain for image analysis: VLSI circuits testing, with Romuald, specialized in parallel image processingPattern Recognition Letters, 1983