A METHODOLOGY FOR FUNCTIONAL LEVEL TESTING OF MICROPROCESSORS
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Processor Testability and Design ConsequencesIEEE Transactions on Computers, 1976
- Techniques for testing the microcomputer familyProceedings of the IEEE, 1976
- Diversified Test Methods for Local Control UnitsIEEE Transactions on Computers, 1975
- On Computer Self-Diagnosis Part I-Experimental Study of a ProcessorIEEE Transactions on Electronic Computers, 1966